Koehler K47920 EDX3000 Benchtop EDXRF Elemental Analyzer

Specification of

Test Method

For the determination of total sulfur in petroleum and petroleum products that are single-phase. These materials can include diesel fuel, jet fuel, kerosene, other distillate oil, naphtha, residual oil, lubricating base oil, hydraulic oil, crude oil, unleaded gasoline, gasohol, and similar petroleum products. Also, for the determination of the total lead content of a gasoline.

Specfications

Conforms to the specifications of: 

ASTM D4294, D5059, D7220, ISO 20847, ISO 8754, IP 496, IP 336, JIS K 2541-1. Correlates to ASTM D2622

Excitation:

• 50 kV X-Ray Tube with Pd Anode
• 50W Maximum Power
• 4 Standard Polarization and Secondary Targets depending on application,
• for optimum excitation
• Optional Fifth Target for Optimal Excitation of Na and Mg

Detection:

• High Performance Silicon Drift Semiconductor Detector
• Peltier Electronic Cooling
• Optimum Balance of spectral resolution and high count rate

Detection Limits (LLD):

1. Sulfur: 0.54 ppm
2. Chlorine: 0.3 ppm
3. Lead: 0.0002 g/L
4. Nickel and Vanadium: 1 ppm
5. Iron: 2 pp,

Sample Chamber:

• Large 38cm dia. X 10cm deep sample chamber for bulk samples
• 15-Position Automatic Sample Changer (32mm Sample Cups)
• Analysis in Air, Helium Purge, or Vacuum Available

User Interface (Computer):

• External PC Computer System including: Microsoft Windows Vista Operating System Keyboard and Mouse, Monitor, Printer

Environmental Conditions:

• Ambient Temperatures 18 - 28°C (65 - 82°F)
• Relative Humidity < 75%
• Vibration undetectable by human
• Free from corrosive gas, dust, and particles

Description

The K47920 EDXRF can analyze a large array of elements from 11Na to 92U in solids, liquids, alloys, powders and thin films. The Advanced model delivers rapid qualitative and quantitative determination of major and minor atomic elements in a wide variety of sample types. The Silicon Drift Detector provides superior data quality and the multiple automated tube filters enhance sensitivity. Also, polarized excitation is used for lower detection limits.